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Wan Sik Nam

Korea University, South Korea

Title: Wafer Yield Prediction based on Virtual Metrology-Generated Variables

Biography

Biography: Wan Sik Nam

Abstract

Wan Sik Nam was born in Seoul, Republic of Korea, He is currently pursuing the B.S. degree from the School of Industrial Management Engineering, Korea University and working for the Samsung Electronics company as a semiconductor manufacturing engineer. His research interests include the yield prediction model of a semiconductor product that is capable of predicting the wafer yield using the variables generated from the virtual metrology in the semiconductor manufacturing.